Menlo Micro’s MM5620 dual DP3T switch operates from DC to 20 GHz, delivering up to 64 Gbps (64 GT/s) while maintaining high data signal integrity. This fully integrated system-in-package (SiP) permits ...
Operating at millimetRE-wave frequencies introduces a set of engineering challenges that extend far beyond traditional radio frequency testing ...
A unique opportunity to address SOC accuracy vs. cost of test challenges comes with the development of BIST Assist 6.4 by Agilent Technologies. When integrated into Agilent�s 93000 Series SOC Tester ...
Bluetooth device manufacturing involves ensuring the quality and performance of devices. One key test that’s used to verify the functionality of Bluetooth devices is the Bluetooth PCM lookback test, ...
Reported as a stable and convenient means to test Small Form-Factor Pluggable (SFP) and Small Form Factor (SFF) devices, the new LC Loopback assembly provides a durable thumb latch and contoured grip ...
The dual-wavelength-attenuated Armadillo loopback provides wavelength-independent signal loss simulation across multiple applications. The loopback features uniform attenuation technology that enables ...